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Microgeometry Capture using an Elastomeric Sensor

Micah K. Johnson, Forrester Cole, Alvin Raj, and Edward H. Adelson

Abstract

We describe a system for capturing microscopic surface geometry. The system extends the retrographic sensor [Johnson and Adelson, 2009] to the microscopic domain, demonstrating spatial resolution as small as 2 microns. In contrast to existing microgeometry capture techniques, the system is not affected by the optical characteristics of the surface being measured - it captures the same geometry whether the object is matte, glossy, or transparent. In addition, the hardware design allows for a variety of form factors, including a hand-held device that can be used to capture high-resolution surface geometry in the field. We achieve these results with a combination of improved sensor materials, illumination design, and reconstruction algorithm, as compared to the original sensor of Johnson and Adelson.

Information

title:
Microgeometry Capture using an Elastomeric Sensor
author:
Micah K. Johnson,
Forrester Cole,
Alvin Raj,
and Edward H. Adelson
citation:
ACM Transactions on Graphics, Proc. SIGGRAPH, 2011
shortcite:
SIGGRAPH
year:
2011
created:
2011-01-01
keyword:
adelson
summary:
microgeometry
pdf:
http://people.csail.mit.edu/kimo/publications/microgeometry/microgeometry.pdf
pageid:
microgeometry
type:
publication
 
publications/microgeometry.1333028188.txt.gz · Last modified: 2012/03/29 09:36 by kimo